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USB High-Speed Validation

This guide covers comprehensive high-speed validation techniques for USB implementations using oscilloscopes and BERTs, characterizing SuperSpeed, SuperSpeed+, and USB4 signals for compliance and design validation.


Equipment Requirements

Oscilloscope Requirements by USB Generation

USB Gen Data Rate Min Bandwidth Recommended BW Min Sample Rate
USB 3.2 Gen1 5 Gbps 8 GHz 12 GHz 25 GSa/s
USB 3.2 Gen2 10 Gbps 12 GHz 16 GHz 40 GSa/s
USB4 Gen2 10 Gbps 12 GHz 16 GHz 40 GSa/s
USB4 Gen3 20 Gbps 20 GHz 25 GHz 80 GSa/s
USB4 Gen4 40 Gbps 33 GHz 50 GHz 128 GSa/s

BERT Requirements by USB Generation

USB Gen Data Rate BERT Requirement Pattern Support
USB 3.2 Gen1 5 Gbps 8+ Gbps CP0-CP7
USB 3.2 Gen2 10 Gbps 15+ Gbps CP0-CP8
USB4 Gen3 20 Gbps 25+ Gbps Compliance patterns
USB4 Gen4 40 Gbps 50+ Gbps Compliance patterns

Real-Time Oscilloscopes:

  • Keysight Infiniium UXR (up to 110 GHz)
  • Keysight Infiniium MXR (up to 16 GHz)
  • Tektronix DPO70000SX (up to 70 GHz)
  • Teledyne LeCroy LabMaster (up to 100 GHz)

Sampling Oscilloscopes:

  • Keysight 86100D DCA-X
  • Tektronix DSA8300

BERTs:

  • Keysight M8040A/M8045A (64 Gbaud)
  • Anritsu MP1900A Signal Quality Analyzer

Oscilloscope Configuration

Vertical Settings

Parameter USB 3.2 USB4 Gen3 USB4 Gen4
Scale 100-200 mV/div 100 mV/div 100 mV/div
Offset Center Center Center
Coupling DC DC DC
Impedance 50Ω 50Ω 50Ω
Bandwidth Full Full Full

Horizontal Settings

Parameter Recommendation
Time/Division 5-10 UI for waveform, 1-2 UI for eye
Sample Rate Maximum available
Memory Depth Sufficient for analysis type
Trigger Position 10% for packet capture

Trigger Configuration

Trigger Type Application
Edge Trigger Basic waveform capture
Pattern Trigger Training sequence capture
Protocol Trigger Link state capture
LFPS Trigger Low-frequency signaling

Transmitter Testing with Oscilloscope

Output Amplitude Measurement

Test Point: At compliance point (typically after connector)

Tx Measurement Setup:

    DUT Tx ════ Test Fixture ════ Oscilloscope
              Compliance Point

Specifications:

Parameter USB 3.2 USB4 Gen3
Vdiff (p-p) 800-1200 mV 800-1200 mV
Vcm -150 to +150 mV -200 to +200 mV

Rise/Fall Time Measurement

Parameter USB 3.2 Gen1 USB 3.2 Gen2 USB4 Gen3
Rise Time (20-80%) 50-150 ps 30-100 ps 20-75 ps
Fall Time (80-20%) 50-150 ps 30-100 ps 20-75 ps

De-emphasis Measurement

USB uses de-emphasis (not pre-emphasis):

De-emphasis Measurement:

    First bit after    Subsequent bits
    transition         (de-emphasized)
         │                   │
         ▼                   ▼
    ────┬────┬────┬────┬────┬────
        │    │    │    │    │
      Full  De-emp De-emp

    De-emphasis ratio = 20 × log10(De-emp / Full) dB
Generation De-emphasis
USB 3.2 Gen1 -3.5 dB
USB 3.2 Gen2 -3.5 dB or configurable
USB4 Gen3 Configurable presets

Transmitter Testing with BERT

BERT Tx Measurement Setup

    DUT Tx ════ Test Fixture ════ BERT Rx (Error Detector)
              Compliance Point

Pattern Selection for USB

Pattern Application
CP0 Compliance pattern 0 (basic)
CP1-CP7 Additional compliance patterns
PRBS Stress testing
Custom Protocol-specific

Tx Measurements with BERT

Measurement Method
Eye Height BER contour scan
Eye Width Timing bathtub
Jitter TIE measurement
Amplitude Statistical distribution

Receiver Testing with BERT

Stressed Eye Calibration

USB Stressed Eye Parameters (USB 3.2 Gen2 example):

Parameter Value
Eye Height 50 mV minimum
Eye Width 0.3 UI minimum
SJ Per specification
RJ Per specification

Rx Sensitivity Testing

    BERT Tx (Stressed Eye) ════ Fixture ════ DUT Rx
            │                                   │
    Calibrated                           Loopback
    Impairments                          (internal)
                                        BERT Rx

Procedure:

  1. Calibrate BERT stressed eye output
  2. Connect to DUT receiver
  3. Configure DUT for loopback
  4. Run BER measurement
  5. Verify BER < 10^-12

Jitter Tolerance (JTOL) Testing

JTOL Test with BERT:

  1. Inject sinusoidal jitter at specified frequency
  2. Increase amplitude until BER exceeds threshold
  3. Record maximum tolerated jitter
  4. Repeat across frequency range
  5. Compare to specification mask

Eye Diagram Analysis

Oscilloscope Eye Measurement

Configuration:

  • Enable eye diagram mode
  • Set clock recovery per USB specification
  • Accumulate 10,000+ waveforms
  • Enable mask testing

BERT Eye Measurement (BER Contour)

BER Contour Eye:

    Voltage
      │  ▓▓▓▓▓▓▓▓▓▓▓▓▓▓▓
      │  ▓▓▓       ▓▓▓▓▓
      │  ▓   10^-12  ▓▓▓
      │  ▓    eye    ▓▓▓
      │  ▓▓▓       ▓▓▓▓▓
      │  ▓▓▓▓▓▓▓▓▓▓▓▓▓▓▓
      └─────────────────▶ Time

Eye Mask Testing

Parameter USB 3.2 Gen1 USB 3.2 Gen2
Min Eye Height 150 mV 100 mV
Min Eye Width 0.4 UI 0.35 UI

LFPS Characterization

Low Frequency Periodic Signaling

LFPS is used for link initialization and power management:

LFPS Waveform:

    ─────┬─────┬─────┬─────┬─────┬─────┬─────
         │     │     │     │     │     │
    ─────┴─────┴─────┴─────┴─────┴─────┴─────
         │◀─────────────────────────────▶│
              LFPS Burst Duration

LFPS Measurements

Parameter Specification
Frequency 20-50 MHz
Amplitude 200-1200 mV (diff)
Duty Cycle 40-60%
Burst Duration Per LFPS type

Oscilloscope LFPS Measurement

  1. Trigger on LFPS burst start
  2. Measure frequency (cycle-to-cycle)
  3. Measure amplitude (peak-to-peak)
  4. Verify duty cycle
  5. Measure burst timing

USB4 Specific Testing

Multi-Lane Capture

USB4 supports multiple lanes (×1, ×2):

Configuration Description
Single Lane 1 Tx + 1 Rx
Dual Lane 2 Tx + 2 Rx (bonded)

Lane Bonding Verification

Measurement Description
Lane-to-lane skew Timing alignment
Lane amplitude matching Signal uniformity
Lane training Successful bonding

Tunneling Protocol Verification

USB4 tunnels multiple protocols:

Protocol Verification
USB 3.2 Tunneled USB traffic
DisplayPort Video tunneling
PCIe PCIe tunneling

Protocol-Synchronized Capture

Training Sequence Capture

Sequence Purpose Trigger
TSEQ Training sequence Pattern trigger
TS1/TS2 Link training Serial pattern
Compliance Compliance mode Mode entry
State Capture Method
Detect LFPS trigger
Polling Training pattern
U0 Normal data
U1/U2/U3 Power states

Jitter Analysis

Oscilloscope Jitter Measurement

Measurement Method
TJ Total jitter (TIE-based)
RJ Random jitter extraction
DJ Deterministic jitter
DDJ Data-dependent jitter

BERT Bathtub Curve

Provides timing margin at target BER:

Bathtub Curve:

    BER
10^-6┤▓▓                              ▓▓
     │  ▓▓                          ▓▓
10^-9┤    ▓▓                      ▓▓
     │      ▓▓                  ▓▓
10^-12┤       ▓▓▓▓▓▓▓▓▓▓▓▓▓▓▓▓▓▓
     └──┬───┬───┬───┬───┬───┬───┬──
        0   0.25  0.5  0.75  1.0
                   UI

Best Practices

Oscilloscope Best Practices

Practice Rationale
Calibrate before test Measurement accuracy
Use proper fixtures Controlled impedance
De-embed cables/fixtures Accurate DUT measurement
Sufficient accumulation Statistical validity

BERT Best Practices

Practice Rationale
Calibrate stressed eye Specification compliance
Verify pattern lock Valid measurement
Sufficient bit count Statistical confidence
Document all settings Reproducibility

Common Issues

Issue Cause Solution
Low eye height Loss, noise Check fixture, improve shielding
LFPS failures Amplitude, timing Verify LFPS generator
BER floor Instrument noise Improve isolation
Trigger instability Signal quality Adjust trigger settings

Test Configurations

Tx Compliance Test

    DUT Tx ════ Compliance Fixture ════ Oscilloscope/BERT
               Compliance Test Point

Rx Sensitivity Test

    BERT (Stressed Tx) ════ Fixture ════ DUT Rx
                                     Loopback
                                       BERT Rx


References

  • USB-IF SuperSpeed Electrical Compliance Test Specification
  • USB4 Electrical Compliance Test Specification
  • USB-IF SigTest software documentation
  • Oscilloscope and BERT manufacturer application notes